Skip to section navigationSkip to content

DCL Services
DDL Offerings
Detector Characterization Lab Services
Device Characterization
Detector characterization

Standard Characterization Tests

  • Readout, CDS, and total noise
  • Dark current
  • Relative and absolute quantum efficiency
  • Conversion and electronic gain
  • Flat-field optical illumination and spot scans (for intra pixel sensitivity)
  • Spatial resolution and MTF (including PSF and low-level halo)
  • CCD charge transfer efficiency using 55Fe (radioactive isotope) and other techniques
  • Crosstalk and inter-pixel capacitance
  • Linearity and well depth
  • Image persistence
  • Stability of detector characteristics
  • General-purpose reconfigurable detector array control and data acquisition electronics including timing pattern generation and optimization
  • Ultra-low background testing in the infrared with specially built and instrumented test cryostats
  • Extensive data analysis capabilities
  • Flight qualification testing

>> Return to Top
Development of focal plane systems, detector arrays, and electronics
Development of focal plane systems, detector arrays, and electronics

Personnel in the DCL can help develop detector systems from the design phase through the entire new product development lifecycle.

Detector Fabrication

Goddard’s Detector Systems Branch also includes the Detector Development Laboratory (link opens new browser window). This MEMS and nanotechnology fabrication facility can be used by U.S. companies, universities, and other government agencies for prototyping and developing semiconductor devices such as focal plane arrays and other radiation detectors.

>> Return to Top
REAG logo
Radiation testing of detector arrays with Goddard’s Radiation Effects and Analysis Group (REAG)

Find out about REAG at: http://radhome.gsfc.nasa.gov/top.htm (link opens new browser wiindow)

 

 

>> Return to Top

 


NASA logo - link to nasa.gov
  • Page Last Updated: Jan 6, 2009
  • Page Editor:
  • NASA Official: